SEMPrep 2 (SC-2000)
SEMPrep 2 (SC-2000) SC-2000 SEMPrep for high-quality site-specific sample preparation for SEM application The SC-2000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical […]